ADVANTEST CORP.

V93000: V93000 Smart Scale generation incorporates per-pin testing capabilities. Each pin runs its own sequencer program for maximum flexibility and performance, for example in multisite applications. Also, V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors., T2000: The T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application., T6391: The T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. This versatility stems from the system's pin-card design, which makes it the best test solution for both engineering and production applications., EVA100: EVA100 is supporting Power Supplies, SMU (4 quadrant DC Signal Measurement Units), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed signal / sensor / digital IC devices and Modules including Electronic Control Unit (ECU) for automotive evaluation and measurement.

T5230: T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve prominent test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer tests of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%., inteXcell: The inteXcell series is an integrated test cell solution that combines a wide range of test functions and high-throughput handling with a highly flexible system architecture that meets the stringent test requirements of the memory IC test process., T5835: The T5835 achieves massive parallelism and test speeds more than double those of previous products, meeting the testing needs of next-generation memory devices with increased speed and capacity., T5503HS2: The T5503HS2 is designed for evaluating DUTs at speeds up to 8 Gbps with an overall timing accuracy of ±45 picoseconds. By using an optional 4.5-GHz high-speed clock, the tester is scalable to support even faster future generations of memory devices.

HA7200: The HA7200 anchors a sensor test cell system that provides an easy-to-use test environment covering all stages of product development, from design evaluation to mass production., HA7300: The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors. It also utilizes temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle., M4841: The M4841 is capable of parallel testing of up to 32 devices. Also, the M4841 also delivers a high throughput of 18,500 devices per hour., M4872: The M4872 features an active Thermal Control function, which controls the test temperature with high accuracy even when testing high-end processors and other high-heat-generating devices. Additionally, it inherits the configuration of the M4871, with 10 automatic stockers that enable highly precise device sorting, while delivering a 10% reduction in footprint., M4171: The M4171 brings automated device loading, unloading, and binning into lab operations, improving upon the manual device handling. The system can be operated remotely from any location worldwide by using a secure intranet connection., M6242: The M6242 supports memory device package types such as BGA and CSP, and its throughput of 42,200 units per hour is more than double that of the company's previous model, M6241. It offers highly efficient device transfer due to the mechanisms that sort good and bad devices after testing. The M6242 enhances productivity and slashes overall cost of test.