Teradyne Inc.

Products

Category Product Brand Description
Semiconductor Machinery Manufacturing (MFG067B)
UltraFLEX
UltraFLEXplus: The UltraFLEXplus combines instrument and software capabilities with a tester infrastructure that provides a step-function improvement in throughput and engineering efficiency., UltraFLEX: The UltraFLEX scales from low pin count, analog-dominant devices to significant parallel test of high-end processors with superior parallel.
J750Ex-HD
J750Ex-HD: The J750Ex-HD reduces the cost of test by 25-50% over competitive offerings with higher throughput and increased site count. Higher site count is delivered by the High Density (HD) family of instruments and software providing the fastest path to lowest cost of test., J750 – LitePoint: It delivers delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
Image Sensor Test System
IP750Ex-HD: The IP750Ex-HD is designed to meet the increasing demands of higher resolution image sensors, expanding test quality standards with varying wavelengths of light and modulation features. The architecture supports 64-bit image data processing to meet the processing demands of increasingly higher resolution sensors, and the data transfer utilizes the fastest data busses to ensure that the fastest test times are achieved.

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